On the possibility of detecting near-surface technological stresses in ceramics by photoacoustic microscopy

Autores: Glazov, A.L.|Muratikov, K.L.
Fuente: Technical physics
54 (3), 431-434

The influence of near-surface technological stresses on the photoacoustic images of Vickers pyramid indentations in silicon nitride ceramics is studied experimentally. It is found that grinding- and polishing-induced stresses in the ceramics influence the behavior of photoacoustic signals coming from the ends of surface cracks. Photoacoustic microscopy data obtained from Vickers-indented areas near the ends of cracks make it possible to estimate technological stresses

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